Measurement of Dielectric Properties at temperatures up to 350ºC with DKV

The use of microwaves in fields as communications, radar, medicine, biology, agriculture and industrial processes demands accurate knowledge of the dielectric properties of materials and its variations with respect to many factors.

In particular, monitoring variations of materials dielectric properties with temperature is crucial for many applications, in which it is important to predict the materials performance over the whole working temperature range.

In order to provide a suitable technique, the Dielectric Kit for Vials has been equipped with the necessary components for the dielectric characterization of materials up to 350ºC. It allows for continuous verification of the sample complex permittivity and temperature conditions, maintaining its advantages with respect to other methods: accuracy, convenience, and easiness of use.

To illustrate this application, several tests have been performed with different materials placed in 1mL vials, and heated from room temperature to 350ºC.

The figures illustrate the variation of the dielectric properties of cross-linked polystyrene (left) and silicon carbide (right) with the temperature. As figures show, this variation can be followed by simple inspection of the dielectric properties given by the Dielectric Kit during the cooling process of the samples.