High Power Waveguide Impedance Measurement System (HiPoM)
Microwave processing is a dynamic process where the properties of the processed workload change with time. Microwave parameters as dielectric properties, reflection, power balance, impedance, and frequency, etc. also experiment changes during the application of high-power microwaves.
On-line measurements of these microwave parameters can offer unique control capabilities, which might be critical for the successful application of microwave processing. Microwave industrial processes require specifically designed equipment to be used according to industrial conditions: high power, simple, affordable and robustness, while retaining a useful subset of their current functionality.
The HiPoM is a High-Power Vector Waveguide Reflectometer (1-port Network Analyzer) able to measure in real time the magnitude and phase of the impedance or the reflection (S11) at microwave frequencies (915 MHz , 2.45 GHz or 5.8 GHz) during the application of high power microwaves. Additionally, the HiPoM measures the frequency of the microwave source (magnetron or solid state) and the absolute incident, reflected and absorbed microwave power.
Typical applications include the tuning or adjusting a microwave applicator and also the monitoring of the evolution of a microwave heating process.
Figure 1. Picture of waveguide high power Vector Reflectometer around 2.45 GHz and 915 MHz.
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